X-ray diffraction

Non-destructive Characterization of Material Properties

X-ray diffraction enables detailed analysis of any material from fundamental research to industrial quality control providing forward looking solutions to our customers today. Applications of these qualitative and quantitative techniques include:


  • Phase Identification
  • Quantitative Analysis
  • Crystal structure determination
  • PDF analysis (total scattering)
  • Small Angle X-Ray Scattering (SAXS)
  • X-Ray Reflectometry (XRR)
  • High Resolution X-Ray Diffraction (HRXRD)
  • Reciprocal Space Mapping (RSM)
  • Residual Stress
  • Texture (pole figures)


D8 crystallographic solutions are the standard for quality and versatility in Single Crystal X-ray diffraction (SC-XRD). A detailed insight into the relationship between structure, function, and reactivity is crucial to the success of modern science.


Single Crystal X-ray diffraction (SC-XRD, SXRD, SCD) is one of the most powerful methods of generating this essential information and has therefore become a key tool for new discoveries.